X-ray Fluorescence - Equipment - Equipment
Equipment

X-ray Fluorescence

Date:01-29-2015    Hits:817

x射线荧光光谱分析(xrf) 

Non-destructive measure the thin metal film thickness and multi-point measure the whole wafer. 4inch to 8 inch wafer all can measure. High precision can measure ultra thin film even only angstroms. This tool can measure the heavy metal element which heavier than N.


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