Parameteric Tester - Equipment - Equipment
Equipment

Parameteric Tester

Date:01-29-2015    Hits:970

磁存储芯片参数测试仪

This tester include EG6000 prober and Agilent 4082 measurement unit, it's has fully automated prober can provide full wafer-level resistance and voltage measurements, and capable of provide a magnetic sensor wafer-level dynamic range test (Rmax to Rmin)


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