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MDT attends Sensor Sensitive Components Test 2013 in Shanghai

Date：03-12-2013    Hits：3630

Sensor Sensitive Components Test + Internet of Things 2013 in Shanghai

(2013/06/25-27)

 Link : http://www.sensorexpo.cn/

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Prev: MDT's new 1uA ultra-low TMR magnetic switch in Honorable Mention of Sensors Expo Innovation Award

Next: MDT attended the 2013 International Financial Exhibition. Advanced TMR currency heads and the solution for paper thickness detection were shown.

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